IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
Abstract
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2010-04-26 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.30 - Transistors |
Stability date | 2025 |
Pages | 20 |
File size | 925 KB |
The following test report forms are related:
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