IEC 62416
IEC 62416:2010
Semiconductor devices - Hot carrier test on MOS transistors
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
CHFÂ 40.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2010-04-26 |
| Edition | 1.0 |
| ICS | 31.080.30 |
| Stability date | 2031 |
| ISBN number | 9782889106950 |
| Pages | 20 |
| File size | 903.26 KB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation