IEC 62525:2007 

Standard Test Interface Language (STIL) for Digital Test Vector Data

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Abstract

Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.

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Additional information

Publication typeInternational Standard
Publication date2007-11-07
Edition1.0
Available language(s)English
TC/SCTC 91 - Electronics assembly technologyrss
ICS25.040.01 - Industrial automation systems in general
19.080 - Electrical and electronic testing
Stability date  2021
Pages143
File size1302 KB

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