IEC 62525:2007
Standard Test Interface Language (STIL) for Digital Test Vector Data
Abstract
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2007-11-07 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 25.040.01 - Industrial automation systems in general 19.080 - Electrical and electronic testing |
Stability date | 2021 |
Pages | 143 |
File size | 1302 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.