IEC 62526:2007 

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

English
CHF 

Do you need a multi-user copy?

English
CHF 

Preview

Abstract

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

Look inside


Additional information

Publication typeInternational Standard
Publication date2007-11-07
Edition1.0
Available language(s)English
TC/SCTC 91 - Electronics assembly technologyrss
ICS25.040.01 - Industrial automation systems in general
Stability date  2025
Pages123
File size1588 KB

The following test report forms are related:



Share this page


Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.


Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.