IEC 62526:2007 

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

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Abstract

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

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Additional information

Publication typeInternational Standard
Publication date2007-11-07
Edition1.0
Available language(s)English
TC/SCTC 91 - Electronics assembly technologyrss
ICS25.040.01 - Industrial automation systems in general
Stability date  2021
Pages123
File size1588 KB

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