IEC 62526:2007
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Abstract
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2007-11-07 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 25.040.01 - Industrial automation systems in general |
Stability date | 2025 |
Pages | 123 |
File size | 1588 KB |
The following test report forms are related:
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