IEC 62527:2007 

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

English
CHF 

Do you need a multi-user copy?

English
CHF 

Preview

Abstract

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Look inside


Additional information

Publication typeInternational Standard
Publication date2007-11-07
Edition1.0
Available language(s)English
TC/SCTC 91 - Electronics assembly technologyrss
ICS25.040.01 - Industrial automation systems in general
Stability date  2021
Pages39
File size1098 KB

The following test report forms are related:


Share this page


Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa), PayPal and bank transfers as form of payment.


Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.