IEC 62527:2007
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Abstract
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2007-11-07 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 25.040.01 - Industrial automation systems in general |
Stability date | 2021 |
Pages | 39 |
File size | 1098 KB |
The following test report forms are related:
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