IEC TS 62607-5-1:2014 

Nanomanufacturing - Key control characteristics - Part 5-1: Thin-film organic/nano electronic devices - Carrier transport measurements

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Abstract

IEC TS 62607-5-1:2014(E) provides a standardized sample structure for characterizing charge transport properties in thin-film organic/nano electronic devices and a format to report details of the structure which shall be provided with the measurement results. The standardized OTFT testing structure with a contact-area-limited doping can mitigate contact resistance and enable reliable measurement of the charge carrier mobility. The purpose of this Technical Specification is to provide test sample structures for determining the intrinsic charge transport properties of organic thin-film devices. The intention is to provide reliable materials information for OTFTs and to set guidelines for making test sample structures so that materials information is clear and consistent throughout the research community and industry.

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Relevant for

nanotechnology


Additional information

Publication typeTechnical Specification
Publication date2014-09-03
Edition1.0
Available language(s)English
TC/SCTC 113 - Nanotechnology for electrotechnical products and systemsrss
ICS07.030 - Physics. Chemistry
07.120 - Nanotechnologies
Stability date  2019
Pages15
File size1073 KB

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