IEC 60747-5-14:2021 PRV 
Pre release version

Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method

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Abstract

This Final Draft International Standard is an up to 6 weeks' pre-release of the official publication. It is available for sale during its voting period: 2021-12-24 to 2022-02-04. By purchasing this FDIS now, you will automatically receive, in addition, the final publication.

IEC 60747-5-14:2022 specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.

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Additional information

Publication typeInternational Standard
Publication date2021-12-24
Edition1.0
Available language(s)English
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.080.99 - Other semiconductor devices
Stability date  2026
Pages21
File size1789 KB

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