IEC 62860-1:2013 

Test methods for the characterization of organic transistor-based ring oscillators

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Abstract

IEC 62860-1:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators. Due to the nature of printed and organic circuits, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators. Keywords: electrical characterization, high-impedance printing, organic transistor, printed electronics, ring oscillator

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Relevant for

nanotechnology


Additional information

Publication typeInternational Standard
Publication date2013-08-05
Edition1.0
Available language(s)English
TC/SCTC 113 - Nanotechnology for electrotechnical products and systemsrss
ICS07.030 - Physics. Chemistry
07.120 - Nanotechnologies
Stability date  2022
Pages20
File size1062 KB

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