IEC TS 62878-2-4:2015
Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)
Abstract
IEC TS 62878-2-4:2015 describes the test element group devices useful when measuring basic properties of device embedded substrates. It is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2015-03-27 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 31.180 - Printed circuits and boards 31.190 - Electronic component assemblies |
Stability date | 2025 |
Pages | 75 |
File size | 3731 KB |
The following test report forms are related:
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