IEC TR 62878-2-2:2015
Device embedded substrate - Part 2-2: Guidelines - Electrical testing
Abstract
IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.
Additional information
Publication type | Technical Report |
---|---|
Publication date | 2015-12-04 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 91 - Electronics assembly technologyrss |
ICS | 31.180 - Printed circuits and boards 31.190 - Electronic component assemblies |
Stability date | 2026 |
Pages | 29 |
File size | 1385 KB |
The following test report forms are related:
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