IEC 60747-9 Revised
IEC 60747-9:2007
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).
The major changes with respect to the previous edition are mainly of an editorial nature.
The major changes with respect to the previous edition are mainly of an editorial nature.
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A more recent version of this publication exists:
IEC 60747-9:2019
Technical committee
TC 47/SC 47E Discrete semiconductor devices| Publication type | International Standard |
| Publication date | 2007-09-26 |
| Edition | 2.0 |
| ICS | 31.080.30 31.080.01 |
| Withdrawal date | 2019-11-13 |
| ISBN number | 2831893216 |
| Pages | 117 |
| File size | 1.59 MB |