IEC 60147-2K:1978 Withdrawn
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Abstract
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1978-01-01 |
| Withdrawal date | 1995-03-31 |
| Edition | 1.0 |
| Available language(s) | English/French, Russian |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.10 - Diodes |
| Stability date | 1995 |
| Pages | 55 |
| File size | 2446 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.