IEC 60147-2K:1978 Withdrawn

Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods


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Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.

Additional information

Publication typeInternational Standard
Publication date1978-01-01
Withdrawal date1995-03-31
Available language(s)English/French, Russian
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.10 - Diodes
File size2446 KB

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