IEC 60444-6:2013 

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

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Abstract

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

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Additional information

Publication typeInternational Standard
Publication date2013-06-19
Edition2.0
Available language(s)English/French
TC/SCTC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss
ICS31.140 - Piezoelectric devices
Stability date  2019
Pages38
File size1206 KB

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