Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
|Publication type||International Standard|
|TC/SC||TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss|
|ICS||31.140 - Piezoelectric devices|
|File size||1206 KB|
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