IEC TS 62916:2017
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
Abstract
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2017-04-10 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 82 - Solar photovoltaic energy systemsrss |
ICS | 27.160 - Solar energy engineering |
Stability date | 2026 |
Pages | 13 |
File size | 1192 KB |
The following test report forms are related:
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