IEC TS 62607-9-1:2021
Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
|Publication type||Technical Specification|
|TC/SC||TC 113 - Nanotechnology for electrotechnical products and systemsrss|
|ICS||07.120 - Nanotechnologies|
|File size||4933 KB|
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