IEC TS 62607-9-1:2021
Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
Abstract
IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.
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Additional information
| Publication type | Technical Specification |
|---|---|
| Publication date | 2021-10-14 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 113 - Nanotechnology for electrotechnical products and systemsrss |
| ICS | 07.120 - Nanotechnologies |
| Stability date | 2024 |
| Pages | 63 |
| File size | 4952 KB |
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