Semiconductor devices - Part 1: General
Note: a more recent version of this publication exists
IEC 60747-1:2006+AMD1:2010 CSV
a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted.
b) There has been a general revision of guidance on essential ratings and characteristics.
c) The distinction between general and reference methods of measurement has been removed.
d) A clause on product discontinuation notice has been added.
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