IEC 60748-11-1:1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Abstract
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1992-04-01 |
| Edition | 1.0 |
| Available language(s) | English/French, Russian |
| TC/SC | TC 47/SC 47A - Integrated circuitsrss |
| ICS | 31.200 - Integrated circuits. Microelectronics |
| Stability date | 2026 |
| Pages | 71 |
| File size | 2350 KB |
The following test report forms are related:
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