IEC 60748-11-1:1992 

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits


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The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

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Additional information

Publication typeInternational Standard
Publication date1992-04-01
Available language(s)English/French, Russian
TC/SCTC 47/SC 47A - Integrated circuitsrss
ICS31.200 - Integrated circuits. Microelectronics
Stability date  2021
File size2350 KB

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