IEC TS 62607-6-6:2021
Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
Abstract
IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic
• strain uniformity
for single-layer graphene by
• Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.
• strain uniformity
for single-layer graphene by
• Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2021-10-14 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 113 - Nanotechnology for electrotechnical products and systemsrss |
ICS | 07.120 - Nanotechnologies |
Stability date | 2024 |
Pages | 27 |
File size | 1829 KB |
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