IEC 61163-1:2006 

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

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Abstract

This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.

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Additional information

Publication typeInternational Standard
Publication date2006-06-26
Edition2.0
Available language(s)English/French, Spanish
TC/SCTC 56 - Dependabilityrss
ICS03.120.01 - Quality in general
03.120.30 - Application of statistical methods
21.020 - Characteristics and design of machines, apparatus, equipment
Stability date  2023
Pages161
File size1517 KB

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