IEC 61163-1:2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
Abstract
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2006-06-26 |
Edition | 2.0 |
Available language(s) | English/French, Spanish |
TC/SC | TC 56 - Dependabilityrss |
ICS | 03.120.01 - Quality in general
03.120.30 - Application of statistical methods 21.020 - Characteristics and design of machines, apparatus, equipment |
Stability date | 2029 |
Pages | 161 |
File size | 1517 KB |
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