IEC 61163-2:1998 

Reliability stress screening - Part 2: Electronic components

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Abstract

Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.

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Additional information

Publication typeInternational Standard
Publication date1998-11-27
Edition1.0
Available language(s)English/French, Spanish
TC/SCTC 56 - Dependabilityrss
ICS03.120.01 - Quality in general
31.020 - Electronic components in general
Stability date  2022
Pages69
File size509 KB

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