IEC TS 61967-3:2014
Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
a) Removal of: Clause 9.4 Data analysis and Annex D Analysing the data from near-field surface scanning;
b) Addition of: Introduction, Clause 9.4 Measurement data, Clause 9.5 Post-processing, Clause 9.6 Data exchange and Annex D Coordinate systems;
c) Expansion of: Clause 8.4 Test technique and Annex A Calibration of near-field probes.
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