IEC 61967-4:2002 Withdrawn
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Abstract
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2002-04-30 |
Withdrawal date | 2021-03-16 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47A - Integrated circuitsrss |
ICS | 31.200 - Integrated circuits. Microelectronics |
Stability date | 2021 |
Pages | 57 |
File size | 2126 KB |
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