IEC 61967-4:2002+AMD1:2006 CSV Withdrawn
Consolidated version
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
Abstract
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2006-07-27 |
| Edition | 1.1 |
| Available language(s) | English/French |
| TC/SC | TC 47/SC 47A - Integrated circuitsrss |
| ICS | 31.200 - Integrated circuits. Microelectronics |
| Stability date | 2021 |
| Pages | 65 |
| File size | 2117 KB |
The following test report forms are related:
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