IEC 62132-2:2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Abstract
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Look inside
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2010-03-30 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47/SC 47A - Integrated circuitsrss |
| ICS | 31.200 - Integrated circuits. Microelectronics |
| Stability date | 2024 |
| Pages | 49 |
| File size | 1211 KB |
The following test report forms are related:
Share your publications
Learn how to share your publications with your colleagues, using networking options.
Payment information
Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.
Keep in touch
Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.
Contact customer services
Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 16:00 CET Monday to Friday.