IEC TS 63342:2022
C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.
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