IEC PAS 62162:2000 Withdrawn
Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
Note: this publication has been replaced by IEC 60749-28:2017
Abstract
Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.
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Additional information
| Publication type | Publicly Available Specification |
|---|---|
| Publication date | 2000-08-22 |
| Withdrawal date | 2017-03-28 |
| Edition | 1.0 |
| Available language(s) | English |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2017 |
| Pages | 7 |
| File size | 207 KB |
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