IEC 62899-402-1:2017 

Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width

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Abstract

IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.

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Additional information

Publication typeInternational Standard
Publication date2017-03-03
Edition1.0
Available language(s)English
TC/SCTC 119 - Printed Electronicsrss
ICS31.180 - Printed circuits and boards
Stability date  2024
Pages12
File size1101 KB

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