IEC 60747-14-11:2021 

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature


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IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.

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Additional information

Publication typeInternational Standard
Publication date2021-03-03
Available language(s)English
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2025
File size2165 KB

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