IEC 63202-1:2019 

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells


Do you need a multi-user copy?




IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

Additional information

Publication typeInternational Standard
Publication date2019-06-20
Available language(s)English/French, Spanish
TC/SCTC 82 - Solar photovoltaic energy systemsrss
ICS27.160 - Solar energy engineering
Stability date  2025
File size1132 KB

The following test report forms are related:

Related publications

Share this page

Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.

Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.