IEC 63202-1:2019
Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
Abstract
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
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Relevant for
water management
smart city
rural electrification
solar power
solar panel
photovoltaic
PV
LVDC
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2019-06-20 |
| Edition | 1.0 |
| Available language(s) | English/French, Spanish |
| TC/SC | TC 82 - Solar photovoltaic energy systemsrss |
| ICS | 27.160 - Solar energy engineering |
| Stability date | 2025 |
| Pages | 17 |
| File size | 1132 KB |
The following test report forms are related:
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