IEC TS 63202-2:2021 

Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells


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IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.

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Additional information

Publication typeTechnical Specification
Publication date2021-12-16
Available language(s)English
TC/SCTC 82 - Solar photovoltaic energy systemsrss
ICS27.160 - Solar energy engineering
Stability date  2025
File size3895 KB

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