IEC TS 63202-2:2021
Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
Abstract
IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2021-12-16 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 82 - Solar photovoltaic energy systemsrss |
ICS | 27.160 - Solar energy engineering |
Stability date | 2025 |
Pages | 19 |
File size | 3895 KB |
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