IEC 61967-6:2002 

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC 61967-6:2002+AMD1:2008 CSV

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Abstract

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

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Additional information

Publication typeInternational Standard
Publication date2002-06-25
Edition1.0
Available language(s)English/French
TC/SCTC 47/SC 47A - Integrated circuitsrss
ICS31.200 - Integrated circuits. Microelectronics
Stability date  2023
Pages51
File size656 KB

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