IEC 61967-6:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Note: a more recent version of this publication exists
IEC 61967-6:2002+AMD1:2008 CSV
Abstract
Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2002-06-25 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47/SC 47A - Integrated circuitsrss |
| ICS | 31.200 - Integrated circuits. Microelectronics |
| Stability date | 2028 |
| Pages | 51 |
| File size | 656 KB |
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