IEC TR 62878-2-2:2015 

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

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Abstract

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

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Additional information

Publication typeTechnical Report
Publication date2015-12-04
Edition1.0
Available language(s)English/French
TC/SCTC 91 - Electronics assembly technologyrss
ICS31.180 - Printed circuits and boards
31.190 - Electronic component assemblies
Stability date  2020
Pages29
File size1385 KB

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