IEC 62047-30:2017
Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
Abstract
IEC 62047-30:2017(E) specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film used for micro sensors and micro actuators, and its reporting schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric devices. This document applies to piezoelectric thin films fabricated by MEMS process
Additional information
Publication type | International Standard |
---|---|
Publication date | 2017-09-15 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 47/SC 47F - Micro-electromechanical systemsrss |
ICS | 31.080.99 - Other semiconductor devices 31.140 - Piezoelectric devices |
Stability date | 2027 |
Pages | 20 |
File size | 1260 KB |
The following test report forms are related:
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